

Semiconductor chips and precision components are easily affected by electromagnetic waves from factory equipment and testing instruments during production and testing, leading to data deviation and performance disorder. Ordinary ESD bags cannot solve EMI problems.
XCGS EMI shielding ESD bags feature dual protection of static dissipation and electromagnetic shielding. Adopting pure aluminum shielding structure to form a closed protective space, the bags meet industry first-level standard for high-frequency shielding performance, effectively blocking external electromagnetic radiation. With stable static releasing performance, the bags prevent circuit breakdown caused by static accumulation. Providing more comprehensive protection than ordinary ESD bags, they eliminate defective issues caused by static and EMI interference. Ideal for chip testing, component inspection, sample circulation and laboratory R&D scenarios, the bags greatly improve testing accuracy and product yield.
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